Title: Methodology for Predicting Microelectronic Substrate Warpage Incorporating Copper Trace Pattern Characteristics When: Thursday, June 5, 2008 at 10:00 AM Where: MARC Building, Room 401
Event Subject
Methodology for Predicting Microelectronic Substrate Warpage Incorporating Copper Trace Pattern Characteristics
Event Speaker
Lucas McCaslin
Event Location
MARC Building, Room 401
Event Date