Title: Stress Metrology and Thermometry of AlGaN/GaN HEMTs Using Optical Methods When: Wednesday, June 26, 2013 at 3:00 PM Where: MRDC Building, Room 4211
Event Subject
Stress Metrology and Thermometry of AlGaN/GaN HEMTs Using Optical Methods
Event Speaker
Sukwon Choi
Event Location
MRDC Building, Room 4211
Event Date