Title: Development of Thin Film Interfacial Fracture Testing Technique using an Intrinsically Stressed Electroplated Metal Layer When: Wednesday, March 5, 2008 at 1:00 PM Where: MARC Building, Room 201
Event Subject
Development of Thin Film Interfacial Fracture Testing Technique using an Intrinsically Stressed Electroplated Metal Layer
Event Speaker
Jamil Ahmad
Event Location
MARC Building, Room 201
Event Date