Ph.D. Proposal Presentation by Bhairav Anuradha Ramanathan
Development of Eddy Current Imaging for Defect Identification and Metrology in Manufacturing Applications
Development of Eddy Current Imaging for Defect Identification and Metrology in Manufacturing Applications
Influence of irradiation damage on stress-assisted grain growth in ultrafine grained Au thin films using in situ transmission electron microscopy mechanical testing
What: Mechanical Engineering Seminar Who: Prof. James Fenton, University of Central Florida - Solar Energy Center When: Tuesday, December 3, 2024 at 10:00 AM Where: MRDC Building Room 4211 Title: Hydrogen and Decarbonization